Kelvin Probe Measurement on graphene exfoliated on strontium titanate (SrTiO3) obtained in non-contact AFM mode using a frequency shift of -5 Hz. The graphene was irradiated with xenon 23+ ions under grazing incidence of 6°. On monolayer the impact of the ions lead to characteristic folding. In Bias-Image the exposed underlying substrate in this area can be clearly seen. Also, the monolayer shows lower surface potential difference to SrTiO3 than few monolayers.
スキャン BudgetSensors ElectriTap300-G
AFM probe on a RHK Technology SPM 1000 Control System
Image courtesy of Benedict Kleine Bussmann, Oliver Ochedowski, Marika Schleberger AG Schleberger, University Duisburg-Essen