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This is a topography image of a holographic, UV optimized, blazed diffraction grating with 2400 lines/mm. It is a good graphic illustration of how much further at the nanoscale Atomic Force Microscopy allows us to ‘see’ beyond what any optical device could. The ridges diffract visible and near-UV light. To light these ridges are perfectly flat. The AFM using a sharp BudgetSensors tip shows us that their surface is actually quite rough.
スキャン BudgetSensors SiNi AFM probe, long cantilever in contact mode, 3 micron scan size
Image courtesy of Dr. Yordan Stefanov, Innovative Solutions Bulgaria
Topography scan of bacteria and negative imprints thereof in dried potato agar
スキャン BudgetSensors SiNi AFM probe, long cantilever, 10 micron scan size
Image courtesy of Dr. Yordan Stefanov, Innovative Solutions Bulgaria