Cd enriched areas in Zn0.4Cd0.6Se, topography and phase image. In order to obtain simultaneously good contrast in the phase image without distortion in the height image, due to surface damage, interleave mode with light tapping conditions for the height scan, and hard tapping for the phase image was used, repectively.
スキャン BudgetSensors Tap150Al-G
AFM probe on a Bruker MultiMode V AFM system. 500 nanometer scan size
Image courtesy of Dr. Irina Bineva, Institute of Solid State Physics, BAS