

Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe MicroscopyMon Oct 28 2019
https://www.mdpi.com/1424-8220/19/20/4510/htm
#AtomicForceMicroscopy #AFMProbes
We’re at JASIS 2019 – you too?
https://www.nanoworld.com/blog/were-at-jasis-2019-you-too/
You’re welcome to visit us @NanoAndMore Japan https://www.nanoandmore.jp/ booth 6A-402 at #JASIS2019 from September 4-6th, 2019 at Makuhari Messe, Japan to learn more about NanoWorld high quality #AFM probes for #AtomicForceMicroscopy and #ScanningProbeMicroscopy #AFMプローブ #原子間力顕微鏡